Clean room contamination






Monitoring of semiconductor manufacturing process and cleanroom environment
Monitoring of emission gas of semiconductor fab
Monitoring of photomask and photoresist process
and environment
Monitoring of display manufacturing process and
environment
Measurement of environmental hormone
substances

Distinct detection of F and Cl
Organic acid detectable
Low temperature water soluble process gas
detectable
Fast and stable monitoring
Automatic solution supply system
Highly sensitive, accurate monitoring
Extensive detection range
Continuous cleaning of sample tubes
Convenient operation and management through
remote control

 

Clean room contamination

Monitoring Ion F-, Cl-, NO2-, Br-, NO3-, and SO42-
Detection Range 0.1~100 ppbv
Limit of Detection 0.10 ppbv for all ions

Sensitivity

0.05 ppbv

Operational Condition

5~40¡É, 0~70%

Precision

 ¡¾3% (F.S)

Detection Time

20 minutes / sample

Sampling Ports

12 (or 24) ports

Communication

RS-232C , TCP/IP

Size

Main Body: 955(W)¡¿615(D)¡¿1729(H)
TCU : 550(W)¡¿613(D)¡¿1280(H)

Power

220(or 110) V, 60 Hz, 10 A



Withtech l portable gas analyzer l airborne molecular contamination l ammonia gas detector l clean room contamination l gas analyzer
Molecular Contamination Monitoring System l Monitoring of water contamination l Metallic Contamination Monitoring System l PPT Level Analysis l sitemap